Paccagnella, Alessandro

Paccagnella, Alessandro  

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Risultati 1 - 14 di 14 (tempo di esecuzione: 0.028 secondi).
Titolo Anno di pubblicazione Autori Unitn File
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility 1-gen-2007 Rech P.Paccagnella A. +
Asymmetrical oxide-charge build-up in irradiated p-MOSFET's 1-gen-1995 Paccagnella, AlessandroVerzellesi, GiovanniDalla Betta, Gian FrancoZEN, MARIOSoncini, Giovanni +
Breakdown properties of multiguarded devices 1-gen-1996 Dalla Betta, Gian FrancoPaccagnella, AlessandroSoncini, GiovanniVerzellesi, Giovanni +
Continuous subcutaneous insulin infusion in Italy: Third national survey 1-gen-2015 Bruttomesso D.Lazzaro N.Gentile S.Guarino G.Zucchini S.Romano S.Zavaroni I.Papi M.Manca E.Zanatta M.Napoli A.Molinari C.Vitale C.Secco A.Lesina A.De Donno V.Barbieri P.Fontana F.Gallo F.Baroni M.Melis M.Di Benedetto A.Fleres M.Lamanna C.Franceschi R.Lalli C.Volpi A.Lombardi S.Costa S.Bruttomesso D.Vedovato M.Paccagnella A.Maffeis C. +
Durability Against Ca(OH)2 Attack of Soda-Lime Glass Coated by Various 1-gen-1989 Carturan, GiovanniDella Mea, GianantonioPaccagnella, AlessandroSorarù, Gian Domenico +
Forward and reverse characteristics of irradiated MOSFET's 1-gen-1996 Paccagnella, AlessandroVerzellesi, GiovanniDalla Betta, Gian FrancoSoncini, Giovanni +
High voltage operation of silicon devices for LHC experiments 1-gen-1998 Dalla Betta, Gian FrancoPaccagnella, AlessandroVerzellesi, Giovanni +
Multiguard structures for high voltage operation of radiation damaged silicon detectors 1-gen-1999 Dalla Betta, Gian FrancoPaccagnella, AlessandroVerzellesi, Giovanni +
Nuclear physics midterm plan at Legnaro National Laboratories (LNL) 1-gen-2023 Campostrini, M.Dell'Aquila, D.Colucci, M.Corradetti, S.de Angelis, G.Giuliani, S. A.Maggioni, G.Nannini, A.Paccagnella, A.Raniero, W.Scarpa, D.Sgarbossa, F.Steiger, H. +
Optimisation of multiguard structures for breakdown protection in silicon detectors 1-gen-1998 Paccagnella, AlessandroDalla Betta, Gian FrancoVerzellesi, Giovanni +
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 1-gen-1990 Paccagnella, AlessandroDapor, Maurizio +
Radiation effects on breakdown characteristics of multiguarded devices 1-gen-1997 Paccagnella, AlessandroVerzellesi, GiovanniDalla Betta, Gian FrancoSoncini, Giovanni +
Self-limitation of edge-generated currents in single-sided microstrip detectors after type inversion 1-gen-1999 Verzellesi, GiovanniDalla Betta, Gian FrancoPignatel, Giorgio UmbertoPaccagnella, Alessandro +
Study of breakdown effects in silicon multiguard structures 1-gen-1999 Paccagnella, AlessandroDalla Betta, Gian FrancoVerzellesi, Giovanni +