Sfoglia per Serie
Standard reference materials for the measurement of instrument resolution functions: effect of transparency
1998-01-01 J. I., Langford; Leoni, Matteo; Scardi, Paolo
Strain-texture correlation in r.f. magnetron sputtered thin films
2000-01-01 Leoni, Matteo; Y., Dong; Scardi, Paolo
Stress and diffusion in Nb-W bilayers
2000-01-01 U., Welzel; P., Lamparter; Leoni, Matteo; E. J., Mittemeijer
Stress in thin layers: grain interaction elastic constants and diffraction response
2000-01-01 J., Kamminga; Leoni, Matteo; U., Welzel; P., Lamparter; E. J., Mittemeijer
Structure-Microstructure Relationships in LiMn2O4 Spinel Phase
1998-01-01 V., Massarotti; M., Bini; D., Capsoni; Scardi, Paolo; Leoni, Matteo
Sub-surface residual stress gradients: advances in laboratory XRD methods
2006-01-01 Azanza Ricardo, Cristy Leonor; D'Incau, Mirco; Scardi, Paolo
Texture Characterization of a Porphyroblastic Pyrope
1994-01-01 A., Amisano Canesi; G., Chiari; Lutterotti, Luca; Scardi, Paolo
The breadth and shape of instrumental line profiles for the powder diffraction station 2.3 at the Daresbury Laboratory SRS
1996-01-01 Scardi, Paolo; Leoni, Matteo; G., Cappuccio; J. I., Langford; R. J., Cernik
Thermal behaviour of monoclinic zirconia at low temperature by XRPD Full Pattern Analysis
1994-01-01 Maistrelli, Paul; Lutterotti, Luca; Scardi, Paolo
Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA
2011-01-01 Ortolani, Matteo; Azanza Ricardo, Cristy Leonor; A., Lausi; Scardi, Paolo
Tungsten Single crystal and Polycristalline Foils used as First Transmission Moderator
1992-01-01 Scardi, Paolo; Brusa, Roberto Sennen; N., Duarte; E., Galvanetto; Zecca, Antonio
WPPM: Microstructural Analysis beyond the Rietveld Method
2010-01-01 Scardi, Paolo; M., Ortolani; Leoni, Matteo
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