This paper presents a discussion on semi-supervised learning of probabilistic mixture model classifiers for face detection. We present a theoretical analysis of semi-supervised learning and show that there is an overlooked fundamental difference between the purely supervised and the semi-supervised learning paradigms. While in the supervised case, increasing the amount of labeled training data is always seen as a way to improve the classifier's performance, the converse might also be true as the number of unlabeled data is increased in the semi-supervised case. We also study the impact of this theoretical finding on Bayesian network classifiers, with the goal of avoiding the performance degradation with unlabeled data. We apply the semi-supervised approach to face detection and we show that learning the structure of Bayesian network classifiers enables learning good classifiers for face detection with a small labeled set and a large unlabeled set.

Semi-supervised Face Detection

Sebe, Niculae;
2005-01-01

Abstract

This paper presents a discussion on semi-supervised learning of probabilistic mixture model classifiers for face detection. We present a theoretical analysis of semi-supervised learning and show that there is an overlooked fundamental difference between the purely supervised and the semi-supervised learning paradigms. While in the supervised case, increasing the amount of labeled training data is always seen as a way to improve the classifier's performance, the converse might also be true as the number of unlabeled data is increased in the semi-supervised case. We also study the impact of this theoretical finding on Bayesian network classifiers, with the goal of avoiding the performance degradation with unlabeled data. We apply the semi-supervised approach to face detection and we show that learning the structure of Bayesian network classifiers enables learning good classifiers for face detection with a small labeled set and a large unlabeled set.
2005
IEEE Workshop on Learning in Computer Vision and Pattern Recognition
Los Alamitos
IEEE
0769526608
Sebe, Niculae; I., Cohen; T. S., Huang; T., Gevers
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/93912
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