Patterns calculated by applying the Debye function to faulted spherical nanoparticles are used to test the accuracy of modern Line Profile Analysis theory of faulting for small crystallites. The relative deviation of the determined fault density is found to be dependent on the fault position, and on the particle size. The study of the average pattern from systems of 100 particles (D = 9.8nm) shows an overestimated deviation of the determined fault density by as much as 30%.
On Faulting in Nanocrystallites of FCC Metals / Beyerlein, Kenneth Roy; Leoni, Matteo; R. L., Snyder; Scardi, Paolo. - STAMPA. - 681:(2011), pp. 13-18. (Intervento presentato al convegno ECRS 8 tenutosi a Riva del Garda, Italy nel 26th - 28th June 2010) [10.4028/www.scientific.net/MSF.681.13].
On Faulting in Nanocrystallites of FCC Metals
Beyerlein, Kenneth Roy;Leoni, Matteo;Scardi, Paolo
2011-01-01
Abstract
Patterns calculated by applying the Debye function to faulted spherical nanoparticles are used to test the accuracy of modern Line Profile Analysis theory of faulting for small crystallites. The relative deviation of the determined fault density is found to be dependent on the fault position, and on the particle size. The study of the average pattern from systems of 100 particles (D = 9.8nm) shows an overestimated deviation of the determined fault density by as much as 30%.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
