Improving the Reconstruction Accuracy of GAs-Based NDE/NDT Methods through a Level Set Approach

In the framework of nondestructive testing and evaluation (NDE/NDT), this paper deals with the problem of the detection of unknown anomalies in dielectric materials. The proposed inverse scattering approach consists of a two-step procedure aimed at firstly estimating the region-of-interest where the defect is supposed to be located and then improving the qualitative imaging (i.e., the shape and position) of the crack. In order to assess the effectiveness of the proposed approach, an illustrative result from representative numerical test cases is presented and discussed.