There are numerous metrics proposed to assess security and dependability of technical systems (e.g., number of defects per thousand lines of code). Unfortunately, most of these metrics are too low-level, and lack on capturing high-level system abstractions required for organisation analysis. The analysis essentially enables the organisation to detect and eliminate possible threats by system re-organisations or re-configurations. In other words, it is necessary to assess security and dependability of organisational structures next to implementations and architectures of systems. This paper focuses on metrics suitable for assessing security and dependability aspects of a socio-technical system and supporting decision making in designing processes. We also highlight how these metrics can help in making the system more effective in providing security and dependability by applying socio-technical solutions (i.e., organisation design patterns). © 2009 IEEE.
Quantitative assessment for organisational security & dependability
Asnar, Yudistira Dwi Wardhana;Massacci, Fabio;Yautsiukhin, Artsiom
2009-01-01
Abstract
There are numerous metrics proposed to assess security and dependability of technical systems (e.g., number of defects per thousand lines of code). Unfortunately, most of these metrics are too low-level, and lack on capturing high-level system abstractions required for organisation analysis. The analysis essentially enables the organisation to detect and eliminate possible threats by system re-organisations or re-configurations. In other words, it is necessary to assess security and dependability of organisational structures next to implementations and architectures of systems. This paper focuses on metrics suitable for assessing security and dependability aspects of a socio-technical system and supporting decision making in designing processes. We also highlight how these metrics can help in making the system more effective in providing security and dependability by applying socio-technical solutions (i.e., organisation design patterns). © 2009 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione



