A brief overview of the texture-residual stress relations is presented together with some simulations, including both the calculation of the X-ray Elastic Constants (XECs) and the modelling of a through-thickness planar residual stress in fibre-textured thin films. Advantages and limits of the X-ray Residual Stress Analysis (XRSA) are discussed, also in relation to the underlying hypotheses. Thin film homogeneity in particular can be a severe limitation to describe real systems.
Residual stresses in polycrystalline thin films / Scardi, Paolo; Y., Dong. - STAMPA. - 347-349:(2000), pp. 399-404. (Intervento presentato al convegno 5th European Conference on Residual Stresses tenutosi a Delft-Noordwijkerhout, Neth nel 28th-30 September 1999).
Residual stresses in polycrystalline thin films
Scardi, Paolo;
2000-01-01
Abstract
A brief overview of the texture-residual stress relations is presented together with some simulations, including both the calculation of the X-ray Elastic Constants (XECs) and the modelling of a through-thickness planar residual stress in fibre-textured thin films. Advantages and limits of the X-ray Residual Stress Analysis (XRSA) are discussed, also in relation to the underlying hypotheses. Thin film homogeneity in particular can be a severe limitation to describe real systems.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
