Direct Detection of Particle Radiation with Perovskite Sensors

In the past decade, organometal halide perovskite (OMHP) semiconductors have been studied as sensors for ionization radiation and X-ray detectors, beside the well known success as photovoltaic devices. Properties such as simple single crystal growth from low-cost solution processes, high stopping power, defect-tolerance, large mobility-lifetime product and tunable bandgap make OMHP very promising materials for novel detectors. An overview of usage of perovskite for radiation detection of charged particles and electromagnetic radiation will be presented. The results of PEROV INFN project will be shown: OHMP based single crystal devices have been developed and tested with electrons from the Beam Test Facility at INFN Frascati National Laboratories, close to the minimum ionizing energy deposition. The crystal sensor can reach the single particle sensitivity with a bias voltage as low as 5 V. It also shows a good linearity of the response as a function of the number of electrons with a dynamic range of approximately 104. Efforts towards the application of OMHP sensors as X-ray detectors will also be also discussed.