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We investigate the criticality of register file and compiler optimization on ARM-based SoCs reliability. The analysis performed using a homemade interruption-based efficient fault injector is correlated with heavy ions experiment results.

Register file criticality on embedded microprocessor reliability / Lins, F.M., Tambara, L., Kastensmidt, F.L., Rech, P.. - 2016-:(2017), pp. 1-5. (16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 deu 2016) [10.1109/RADECS.2016.8093143].

Register file criticality on embedded microprocessor reliability

Rech P.
2017-01-01

Abstract

We investigate the criticality of register file and compiler optimization on ARM-based SoCs reliability. The analysis performed using a homemade interruption-based efficient fault injector is correlated with heavy ions experiment results.
2017
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
United States
Institute of Electrical and Electronics Engineers Inc.
978-1-5090-4366-8
2-s2.0-85043576758
Lins, F. M.; Tambara, L.; Kastensmidt, F. L.; Rech, P.
Register file criticality on embedded microprocessor reliability / Lins, F.M., Tambara, L., Kastensmidt, F.L., Rech, P.. - 2016-:(2017), pp. 1-5. (16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 deu 2016) [10.1109/RADECS.2016.8093143].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/403737
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