This work reviews recent molecular statistics (MS) numerical experiments of cracked samples, and discusses the crack-tip region stress field of ideal brittle materials. Continuum-based linear elastic fracture mechanics, indeed, breaks down at extremely small scale, where the discrete nature of atoms is considered. Surprisingly, recent results have shown that the concept of stress intensity factor (SIF) is still valid. In this work, by means of MS simulations on single-edge cracked samples of ideal brittle silicon, it is shown that the stress intensity factor derived from the virial stress may be useful to describe the fracture at extremely small dimensions and to quantify the breakdown of continuum-based linear elastic fracture mechanics. However, it is still debated whether a continuum-based concept such as the “stress” should be applied to a system made of atoms.

Some Considerations on Stress Intensity Factor at Atomic Scale / Gallo, Pasquale. - ELETTRONICO. - 16:(2020), pp. 319-324. (Intervento presentato al convegno ICTAEM 2020 tenutosi a Athens nel 14th-17th June 2020) [10.1007/978-3-030-47883-4_57].

Some Considerations on Stress Intensity Factor at Atomic Scale

Gallo, Pasquale
2020-01-01

Abstract

This work reviews recent molecular statistics (MS) numerical experiments of cracked samples, and discusses the crack-tip region stress field of ideal brittle materials. Continuum-based linear elastic fracture mechanics, indeed, breaks down at extremely small scale, where the discrete nature of atoms is considered. Surprisingly, recent results have shown that the concept of stress intensity factor (SIF) is still valid. In this work, by means of MS simulations on single-edge cracked samples of ideal brittle silicon, it is shown that the stress intensity factor derived from the virial stress may be useful to describe the fracture at extremely small dimensions and to quantify the breakdown of continuum-based linear elastic fracture mechanics. However, it is still debated whether a continuum-based concept such as the “stress” should be applied to a system made of atoms.
2020
Proceedings of the Third International Conference on Theoretical, Applied and Experimental Mechanics
Cham, CH
Springer
978-3-030-47883-4
978-3-030-47882-7
Gallo, Pasquale
Some Considerations on Stress Intensity Factor at Atomic Scale / Gallo, Pasquale. - ELETTRONICO. - 16:(2020), pp. 319-324. (Intervento presentato al convegno ICTAEM 2020 tenutosi a Athens nel 14th-17th June 2020) [10.1007/978-3-030-47883-4_57].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/403661
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