X-ray diffraction from thin films: size/strain analysis and whole pattern fitting, in Thin Film Characterisation by Advanced X-ray Diffraction Techniques / Scardi, Paolo. - 49:(1996), pp. 85-112. (Intervento presentato al convegno 5th school on X-ray Diffraction from Polycrystalline Materials tenutosi a Roma nel 1996).
X-ray diffraction from thin films: size/strain analysis and whole pattern fitting, in Thin Film Characterisation by Advanced X-ray Diffraction Techniques
Scardi, Paolo
1996-01-01
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