The design, modeling, fabrication, and experimental measurements on optical nanobeam cavities that change resonant frequency in response to changes in the refractive index of the surrounding environment are presented. Nanobeam cavities based on Silicon-On-Insulator (SOI) that work at telecommunication wavelengths (1550 nm) provide an ideal platform for label-free sensing, due to their features of high resonance Q-factors, high sensitivity and capability for integration with silicon CMOS.

High-Q optical nanobeam cavities for label-free sensing / M., Ghazali A. Rahman; Velha, Philippe; De La Rue, Richard M.; Johnson, Nigel P.. - 8774:(2013), p. 87740G. ( Optical Sensors 2013 Prague, Czech Republic 2013) [10.1117/12.2017696].

High-Q optical nanobeam cavities for label-free sensing

VELHA, PHILIPPE
Secondo
;
2013-01-01

Abstract

The design, modeling, fabrication, and experimental measurements on optical nanobeam cavities that change resonant frequency in response to changes in the refractive index of the surrounding environment are presented. Nanobeam cavities based on Silicon-On-Insulator (SOI) that work at telecommunication wavelengths (1550 nm) provide an ideal platform for label-free sensing, due to their features of high resonance Q-factors, high sensitivity and capability for integration with silicon CMOS.
2013
Proceedings of SPIE - The International Society for Optical Engineering
Pennington
SPIE-INT SOC OPTICAL ENGINEERING
9780819495761
M., Ghazali A. Rahman; Velha, Philippe; De La Rue, Richard M.; Johnson, Nigel P.
High-Q optical nanobeam cavities for label-free sensing / M., Ghazali A. Rahman; Velha, Philippe; De La Rue, Richard M.; Johnson, Nigel P.. - 8774:(2013), p. 87740G. ( Optical Sensors 2013 Prague, Czech Republic 2013) [10.1117/12.2017696].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/373135
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