In this contribution, an innovative methodology aimed at increasing the amount of scattering data (avoiding further a-priori assumptions on the investigation domain) is analyzed. According to the multi-source (MS) approach, the investigation domain is illuminated by means of different probing sources, each of them characterized by a proper (and different) radiation pattern, to induce different scattering interactions able to show" different "aspects" of the scatterer under test. Integrated with a multi-view strategy and recurring to the iterative multi-scaling procedure [Donelli et al., 2006]
Dealing with Aspect-Limited Data Through an Innovative Microwave Imaging Multi-Source Technique: Potentialities and Limitations / Franceschini, Davide; Benedetti, Manuel; Donelli, Massimo; Rocca, Paolo; Massa, Andrea. - ELETTRONICO. - (2011).
Dealing with Aspect-Limited Data Through an Innovative Microwave Imaging Multi-Source Technique: Potentialities and Limitations
Franceschini, DavidePrimo
;Benedetti, ManuelSecondo
;Donelli, Massimo;Rocca, PaoloPenultimo
;Massa, Andrea
Ultimo
2011-01-01
Abstract
In this contribution, an innovative methodology aimed at increasing the amount of scattering data (avoiding further a-priori assumptions on the investigation domain) is analyzed. According to the multi-source (MS) approach, the investigation domain is illuminated by means of different probing sources, each of them characterized by a proper (and different) radiation pattern, to induce different scattering interactions able to show" different "aspects" of the scatterer under test. Integrated with a multi-view strategy and recurring to the iterative multi-scaling procedure [Donelli et al., 2006]File | Dimensione | Formato | |
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