The conformance test to which electronic devices are subjected after the manufacturing process, indicates if the device complies with an a priori given requirement set. On the basis of the test result, the component is considered to be working or not–working. However, because of the measurement uncertainty introduced by the testing bench assessment and by the chosen estimation algorithm, the manufacturer could include in the production process a component which does not respect the given requirements or could reject a working–device, thus affecting both testing and productivity costs. In this paper, it is considered the problem of the estimation of spectral parameters of analog–to–digital converters (ADCs). In particular, the risks to which both manufacturers and consumers of ADCs are subjected, are explicitly evaluated.

A Risks Assessment and Conformance Testing of Analog-to-Digital Converters / Nunzi, Emilia; Carbone, Paolo; Petri, Dario. - ELETTRONICO. - (2004).

A Risks Assessment and Conformance Testing of Analog-to-Digital Converters

Carbone, Paolo;Petri, Dario
2004-01-01

Abstract

The conformance test to which electronic devices are subjected after the manufacturing process, indicates if the device complies with an a priori given requirement set. On the basis of the test result, the component is considered to be working or not–working. However, because of the measurement uncertainty introduced by the testing bench assessment and by the chosen estimation algorithm, the manufacturer could include in the production process a component which does not respect the given requirements or could reject a working–device, thus affecting both testing and productivity costs. In this paper, it is considered the problem of the estimation of spectral parameters of analog–to–digital converters (ADCs). In particular, the risks to which both manufacturers and consumers of ADCs are subjected, are explicitly evaluated.
2004
Trento, Italia
Università degli Studi di Trento. DEPARTMENT OF INFORMATION AND COMMUNICATION TECHNOLOGY
A Risks Assessment and Conformance Testing of Analog-to-Digital Converters / Nunzi, Emilia; Carbone, Paolo; Petri, Dario. - ELETTRONICO. - (2004).
Nunzi, Emilia; Carbone, Paolo; Petri, Dario
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/359050
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