In this paper a linearized version of the four-parameter sine-fit algorithm suggested in the IEEE Standard 1241 for the dynamic testing of analog-To-digital converters is proposed. Algorithm linearization is performed through the Gauss-Newton method and the related closed form expressions are provided. The accuracies of the proposed and the classical versions of the four-parameter sine-fit algorithm are compared each other by means of both computer simulations and experimental results.
Analog-To-Digital Converter Dynamic Testing by Linearized Four-Parameter Sine-Fit Algorithm / Belega, D.; Petri, D.. - ELETTRONICO. - (2021), pp. 502-506. (Intervento presentato al convegno 6th International Forum on Research and Technology for Society and Industry, RTSI 2021 tenutosi a ita nel 2021) [10.1109/RTSI50628.2021.9597328].
Analog-To-Digital Converter Dynamic Testing by Linearized Four-Parameter Sine-Fit Algorithm
Petri D.
2021-01-01
Abstract
In this paper a linearized version of the four-parameter sine-fit algorithm suggested in the IEEE Standard 1241 for the dynamic testing of analog-To-digital converters is proposed. Algorithm linearization is performed through the Gauss-Newton method and the related closed form expressions are provided. The accuracies of the proposed and the classical versions of the four-parameter sine-fit algorithm are compared each other by means of both computer simulations and experimental results.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
