The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.
Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM / Wan, Q.; Plenderleith, R. A.; Dapor, M.; Rimmer, S.; Claeyssens, F.; Rodenburg, C.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 644:1(2015), p. 012018. (Intervento presentato al convegno Electron Microscopy and Analysis Group Conference, EMAG 2015 tenutosi a gbr nel 2015) [10.1088/1742-6596/644/1/012018].
Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM
Dapor M.;
2015-01-01
Abstract
The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
