The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.

Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM / Wan, Q.; Plenderleith, R. A.; Dapor, M.; Rimmer, S.; Claeyssens, F.; Rodenburg, C.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 644:1(2015), p. 012018. (Intervento presentato al convegno Electron Microscopy and Analysis Group Conference, EMAG 2015 tenutosi a gbr nel 2015) [10.1088/1742-6596/644/1/012018].

Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM

Dapor M.;
2015-01-01

Abstract

The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.
2015
Journal of Physics: Conference Series
DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND
Institute of Physics Publishing
Wan, Q.; Plenderleith, R. A.; Dapor, M.; Rimmer, S.; Claeyssens, F.; Rodenburg, C.
Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM / Wan, Q.; Plenderleith, R. A.; Dapor, M.; Rimmer, S.; Claeyssens, F.; Rodenburg, C.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 644:1(2015), p. 012018. (Intervento presentato al convegno Electron Microscopy and Analysis Group Conference, EMAG 2015 tenutosi a gbr nel 2015) [10.1088/1742-6596/644/1/012018].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/325764
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