An innovative strategy for predicting the tolerance on the radiation pattern due to the mutual coupling effects between the radiating elements of linear antenna arrays is presented. Assuming known the maximum deviations of the element amplitudes with respect to the nominal ones, the errors on the excitation coefficients are modeled as circular intervals and an approach based on the Interval Analysis is used to analytically determine the upper and lower bounds of the power pattern. A representative result is presented to show the validity of the proposed method also in comparison with a state-of-the-art solution.

Sensitivity analysis of mutual coupling effects in antenna arrays through interval analysis / Anselmi, Nicola; Poli, Lorenzo; Rocca, Paolo; Viani, Federico; Massa, Andrea. - (2015), pp. 426-427. ((Intervento presentato al convegno 2015 IEEE AP-S tenutosi a Vancouver nel July 19-25, 2015 [10.1109/APS.2015.7304599].

Sensitivity analysis of mutual coupling effects in antenna arrays through interval analysis

Anselmi, Nicola;Poli, Lorenzo;Rocca, Paolo;Viani, Federico;Massa, Andrea
2015

Abstract

An innovative strategy for predicting the tolerance on the radiation pattern due to the mutual coupling effects between the radiating elements of linear antenna arrays is presented. Assuming known the maximum deviations of the element amplitudes with respect to the nominal ones, the errors on the excitation coefficients are modeled as circular intervals and an approach based on the Interval Analysis is used to analytically determine the upper and lower bounds of the power pattern. A representative result is presented to show the validity of the proposed method also in comparison with a state-of-the-art solution.
2015 IEEE Antennas and Propagation Society International Symposium Proceedings
Piscataway, NJ
IEEE
978-1-4799-7815-1
Anselmi, Nicola; Poli, Lorenzo; Rocca, Paolo; Viani, Federico; Massa, Andrea
Sensitivity analysis of mutual coupling effects in antenna arrays through interval analysis / Anselmi, Nicola; Poli, Lorenzo; Rocca, Paolo; Viani, Federico; Massa, Andrea. - (2015), pp. 426-427. ((Intervento presentato al convegno 2015 IEEE AP-S tenutosi a Vancouver nel July 19-25, 2015 [10.1109/APS.2015.7304599].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11572/120197
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