This work presents an innovative inversion method for non-destructive localization and characterization of defects based on a Learning-by-Example (LBE) approach. The qualitative imaging of the electromagnetic anomalies affecting a conductive structure is based on the exploitation of Eddy Current Testing (ECT) measurements through Support Vector Regression (SVR), enabling an evaluation of the structure under test almost in real-time. Some preliminary numerical results are shown in order to validate the effectiveness of the proposed method.

A learning-by-examples approach for non-destructive localization and characterization of defects through eddy current measurements / Salucci, M.; Oliveri, Giacomo; Viani, Federico; Miorelli, R.; Reboud, C.; Calmon, P.; Massa, Andrea. - (2015), pp. 900-901. (Intervento presentato al convegno 2015 IEEE AP-S tenutosi a Vancouver nel July 19-25, 2015) [10.1109/APS.2015.7304837].

A learning-by-examples approach for non-destructive localization and characterization of defects through eddy current measurements

M. Salucci;Oliveri, Giacomo;Viani, Federico;Massa, Andrea
2015-01-01

Abstract

This work presents an innovative inversion method for non-destructive localization and characterization of defects based on a Learning-by-Example (LBE) approach. The qualitative imaging of the electromagnetic anomalies affecting a conductive structure is based on the exploitation of Eddy Current Testing (ECT) measurements through Support Vector Regression (SVR), enabling an evaluation of the structure under test almost in real-time. Some preliminary numerical results are shown in order to validate the effectiveness of the proposed method.
2015
2015 IEEE Antennas and Propagation Society International Symposium Proceedings
Piscataway, NJ
IEEE
978-1-4799-7815-1
Salucci, M.; Oliveri, Giacomo; Viani, Federico; Miorelli, R.; Reboud, C.; Calmon, P.; Massa, Andrea
A learning-by-examples approach for non-destructive localization and characterization of defects through eddy current measurements / Salucci, M.; Oliveri, Giacomo; Viani, Federico; Miorelli, R.; Reboud, C.; Calmon, P.; Massa, Andrea. - (2015), pp. 900-901. (Intervento presentato al convegno 2015 IEEE AP-S tenutosi a Vancouver nel July 19-25, 2015) [10.1109/APS.2015.7304837].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/120101
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