Sol-gel derived multilayer ZnO thin films were successfully prepared by spin coating technique on glass, Si wafer and platinum substrates. Structural and morphological features of the samples were investigated by field emission scanning electron microscopy (FE-SEM) and X-ray diffraction (XRD) analysis. The combined techniques assess that uniform flawless films with preferable c - Axis orientation of the ZnO crystallites could be obtained. The preliminary electrical measurements on sol-gel derived SiO2/Ti/Pt/ZnO/Ag systems showed memristive behavior, and the detailed studies of switching response are in progress.
Structural characterization of sol-gel ZnO thin films on different substrates for memristive application / Ayana, Dawit Gemechu; Prusakova, Valentina; Ceccato, Riccardo; Dirè, Sandra. - (2015). (Intervento presentato al convegno 18th Conference on Sensors and Microsystems, AISEM 2015 tenutosi a Trento nel 3- 5 February 2015) [10.1109/AISEM.2015.7066799].
Structural characterization of sol-gel ZnO thin films on different substrates for memristive application
Ayana, Dawit Gemechu;Prusakova, Valentina;Ceccato, Riccardo;Dirè, Sandra
2015-01-01
Abstract
Sol-gel derived multilayer ZnO thin films were successfully prepared by spin coating technique on glass, Si wafer and platinum substrates. Structural and morphological features of the samples were investigated by field emission scanning electron microscopy (FE-SEM) and X-ray diffraction (XRD) analysis. The combined techniques assess that uniform flawless films with preferable c - Axis orientation of the ZnO crystallites could be obtained. The preliminary electrical measurements on sol-gel derived SiO2/Ti/Pt/ZnO/Ag systems showed memristive behavior, and the detailed studies of switching response are in progress.File | Dimensione | Formato | |
---|---|---|---|
AISEM_PID3604861.pdf
Solo gestori archivio
Tipologia:
Versione editoriale (Publisher’s layout)
Licenza:
Tutti i diritti riservati (All rights reserved)
Dimensione
516.48 kB
Formato
Adobe PDF
|
516.48 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione