Somoza, Alberto Horacio
 Distribuzione geografica
Continente #
NA - Nord America 312
AS - Asia 82
EU - Europa 71
SA - Sud America 16
AF - Africa 1
OC - Oceania 1
Totale 483
Nazione #
US - Stati Uniti d'America 308
SG - Singapore 47
CN - Cina 22
RU - Federazione Russa 20
BR - Brasile 14
SE - Svezia 11
DE - Germania 8
UA - Ucraina 8
GB - Regno Unito 6
FI - Finlandia 5
CA - Canada 4
LV - Lettonia 4
VN - Vietnam 4
BG - Bulgaria 2
CZ - Repubblica Ceca 2
FR - Francia 2
IN - India 2
IT - Italia 2
TR - Turchia 2
AR - Argentina 1
AU - Australia 1
BD - Bangladesh 1
GM - Gambi 1
HK - Hong Kong 1
ID - Indonesia 1
JP - Giappone 1
PE - Perù 1
PH - Filippine 1
RO - Romania 1
Totale 483
Città #
Fairfield 43
Ashburn 36
Singapore 32
Chandler 28
Jacksonville 17
Wilmington 17
Woodbridge 15
Ann Arbor 14
Houston 14
Seattle 12
Santa Clara 11
Cambridge 10
Columbus 9
Dallas 7
San Mateo 7
Moscow 6
Beijing 5
Princeton 5
Bremen 4
London 4
Munich 4
New York 4
Riga 4
Los Angeles 3
Boardman 2
Brno 2
Buffalo 2
Chicago 2
Council Bluffs 2
Dearborn 2
Helsinki 2
Montreal 2
Porto Alegre 2
San Diego 2
Sofia 2
Atlanta 1
Bagé 1
Baltimore 1
Banjul 1
Belo Horizonte 1
Biñan 1
Brooklyn 1
Capanema 1
Chennai 1
Chittagong 1
Chongqing 1
Denver 1
Des Moines 1
Goiana 1
Hangzhou 1
Hefei 1
Ho Chi Minh City 1
Hong Kong 1
Istanbul 1
Jaguarari 1
Jakarta 1
Konya 1
Lawrence 1
Lima 1
Manchester 1
Muriaé 1
Nanjing 1
New Bedfont 1
Nova Iguaçu 1
Nova Santa Rita 1
Oberá 1
Oklahoma City 1
Pittsburgh 1
Salt Lake City 1
San Francisco 1
San Paolo di Civitate 1
Santa Bárbara d'Oeste 1
São José do Rio Preto 1
São Mateus 1
São Paulo 1
The Dalles 1
Tokyo 1
Toronto 1
Trento 1
Vancouver 1
Vanves 1
Washington 1
Totale 380
Nome #
Niobium aggregation and vacancylike defect evolution in nanostructured Nb-doped Mg:Their role in the kinetics of the hydride-to-metal phase transformation 146
CO_2 Laser irradiation of GeO_2 planar waveguide fabricated by rf-sputtering 141
Depth profiling and morphological characterization of AlN thin films deposited on Si substrates using a reactive sputter magnetron 133
Oxygen Related Defects and Vacancy Clusters Identified in Sputtering Grown UOx Thin Films by Positron Annihilation Techniques 76
Totale 496
Categoria #
all - tutte 2.475
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.475


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202125 0 0 0 0 0 2 2 7 2 3 3 6
2021/202242 0 10 2 2 2 0 2 9 1 3 4 7
2022/202362 9 8 0 14 8 7 1 5 6 1 3 0
2023/202416 1 5 3 0 0 1 0 0 1 0 0 5
2024/202588 0 0 8 17 7 11 1 3 12 20 3 6
2025/2026114 18 7 25 29 32 3 0 0 0 0 0 0
Totale 496