The knowledge of the evolution in temperature of a nanocrystalline material is the key to its optimization for industrial applications. Synchrotron radiation X-ray diffraction and modern line profile analysis (e.g. the Whole Powder Pattern Modeling) are ideal tools to follow in situ kinetics on the nanoscale. The microstructure evolution data obtained from the analysis of diffraction patterns collected in ramp at several heating rates, show how X-ray diffraction can be the ideal complementary tool to thermal analysis. Basics and examples will be discussed
Kinetic studies of microstructure evolution in nanostructured materials
Leoni, Matteo;Scardi, Paolo;D'Incau, Mirco
2011-01-01
Abstract
The knowledge of the evolution in temperature of a nanocrystalline material is the key to its optimization for industrial applications. Synchrotron radiation X-ray diffraction and modern line profile analysis (e.g. the Whole Powder Pattern Modeling) are ideal tools to follow in situ kinetics on the nanoscale. The microstructure evolution data obtained from the analysis of diffraction patterns collected in ramp at several heating rates, show how X-ray diffraction can be the ideal complementary tool to thermal analysis. Basics and examples will be discussedFile in questo prodotto:
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