With organic photovoltaic (OPV) technology moving towards commercialisation, high-throughput analytical techniques are required to study the nanoscale morphology of OPV blends. We demonstrate a low-voltage backscattered electron imaging technique in the SEM that combines a solid-state backscattered electron detector with stage biasing to produce a rapid overview of the phase-separated surface morphology of an organic photovoltaic (P3HT:PCBM) blend. Aspects of obtaining the best possible results from the technique are discussed along with the possibility of probing the sub-surface morphology by altering the primary electron beam landing energy.
Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies / Masters, R. C.; Wan, Q.; Zhou, Y.; Sandu, A. M.; Dapor, M.; Zhang, H.; Lidzey, D. G.; Rodenburg, C.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 644:1(2015), p. 012017. (Intervento presentato al convegno Electron Microscopy and Analysis Group Conference, EMAG 2015 tenutosi a gbr nel 2015) [10.1088/1742-6596/644/1/012017].
Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies
Dapor M.;
2015-01-01
Abstract
With organic photovoltaic (OPV) technology moving towards commercialisation, high-throughput analytical techniques are required to study the nanoscale morphology of OPV blends. We demonstrate a low-voltage backscattered electron imaging technique in the SEM that combines a solid-state backscattered electron detector with stage biasing to produce a rapid overview of the phase-separated surface morphology of an organic photovoltaic (P3HT:PCBM) blend. Aspects of obtaining the best possible results from the technique are discussed along with the possibility of probing the sub-surface morphology by altering the primary electron beam landing energy.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
