Untextured bulk polycrystals usually possess macroscopically isotropic elastic properties whereas for most thin films transverse isotropy is expected, owing to the limited dimensionality. The usually applied models for the calculation of elastic constants of polycrystals from single crystal elastic constants (so-called grain interaction models) erroneously predict macroscopic isotropy for an untextured thin film. The paper presents a summary of recent work where it has been demonstrated for the first time by X-ray diffraction analysis of stresses in thin films that the elastic grain interaction can lead to macroscopically elastically anisotropic behaviour (shown by non-linear sin2ψ plots). A new grain interaction model, which can be used to predict the macroscopically anisotropic behaviour of thin films, is proposed.

Stress in thin films; diffraction elastic constants and grain interaction / Welzel, U.; Leoni, M.; Lamparter, P.; Mittemeijer, E. J.. - In: JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY. - ISSN 1005-0302. - STAMPA. - 18:2(2002), pp. 121-124.

Stress in thin films; diffraction elastic constants and grain interaction

Leoni M.;
2002-01-01

Abstract

Untextured bulk polycrystals usually possess macroscopically isotropic elastic properties whereas for most thin films transverse isotropy is expected, owing to the limited dimensionality. The usually applied models for the calculation of elastic constants of polycrystals from single crystal elastic constants (so-called grain interaction models) erroneously predict macroscopic isotropy for an untextured thin film. The paper presents a summary of recent work where it has been demonstrated for the first time by X-ray diffraction analysis of stresses in thin films that the elastic grain interaction can lead to macroscopically elastically anisotropic behaviour (shown by non-linear sin2ψ plots). A new grain interaction model, which can be used to predict the macroscopically anisotropic behaviour of thin films, is proposed.
2002
2
Welzel, U.; Leoni, M.; Lamparter, P.; Mittemeijer, E. J.
Stress in thin films; diffraction elastic constants and grain interaction / Welzel, U.; Leoni, M.; Lamparter, P.; Mittemeijer, E. J.. - In: JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY. - ISSN 1005-0302. - STAMPA. - 18:2(2002), pp. 121-124.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/294385
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