Non-Intrusive Load Monitoring (NILM) implies disaggregating the power consumption of individual appliances from a single power measurement point. Recent approaches use a mix of low and high-frequency features, but real-time NILM on low-cost and resource-constrained smart meters is still challenging due to the computing effort needed for feature extraction and classification. In this paper, we present a thorough survey on low, mid, and high-frequency features for enabling the deployment of NILM algorithms on edge-devices. We compare four different supervised learning techniques on different use-cases. Moreover, we developed a novel Microcontroller (MCU) based Smart Measurement Node for collecting measurements, providing computational capabilities to perform NILM on-the-edge. Experimental results demonstrate that by selecting the proper features, a robust disaggregation model for real-time load monitoring is feasible on our MCU-based meter with an accuracy of 95.99%, relying on merely 9.4kB of memory requirements and 16K MACs operation.

A Feature Reduction Strategy for Enabling Lightweight Non-Intrusive Load Monitoring on Edge Devices / Tabanelli, Enrico; Brunelli, Davide; Benini, Luca. - 2020-:(2020), pp. 805-810. (Intervento presentato al convegno ISIE 2020 tenutosi a Delft, Netherlands nel 17th-19th June 2020) [10.1109/ISIE45063.2020.9152277].

A Feature Reduction Strategy for Enabling Lightweight Non-Intrusive Load Monitoring on Edge Devices

Brunelli, Davide;
2020-01-01

Abstract

Non-Intrusive Load Monitoring (NILM) implies disaggregating the power consumption of individual appliances from a single power measurement point. Recent approaches use a mix of low and high-frequency features, but real-time NILM on low-cost and resource-constrained smart meters is still challenging due to the computing effort needed for feature extraction and classification. In this paper, we present a thorough survey on low, mid, and high-frequency features for enabling the deployment of NILM algorithms on edge-devices. We compare four different supervised learning techniques on different use-cases. Moreover, we developed a novel Microcontroller (MCU) based Smart Measurement Node for collecting measurements, providing computational capabilities to perform NILM on-the-edge. Experimental results demonstrate that by selecting the proper features, a robust disaggregation model for real-time load monitoring is feasible on our MCU-based meter with an accuracy of 95.99%, relying on merely 9.4kB of memory requirements and 16K MACs operation.
2020
2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020)
Piscataway, NJ
Institute of Electrical and Electronics Engineers Inc.
978-1-7281-5635-4
978-1-7281-5636-1
Tabanelli, Enrico; Brunelli, Davide; Benini, Luca
A Feature Reduction Strategy for Enabling Lightweight Non-Intrusive Load Monitoring on Edge Devices / Tabanelli, Enrico; Brunelli, Davide; Benini, Luca. - 2020-:(2020), pp. 805-810. (Intervento presentato al convegno ISIE 2020 tenutosi a Delft, Netherlands nel 17th-19th June 2020) [10.1109/ISIE45063.2020.9152277].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/279956
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