A novel microwave imaging (MI) method is proposed to deal with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures. The proposed technique exploits a probabilistic differential contrast source inversion (D-CSI) formulation of the inverse scattering (IS) problem, which is then effectively solved by means of a customized multi-Task Bayesian compressive sensing (MT-BCS) solver. Numerical results are shown to assess the effectiveness and robustness of the proposed NDT/NDE method, as well as to compare it. with a single-Task (ST-BCS) implementation within the same framework.

NDT/NDE by means of a probabilistic differential compressive sensing method / Gottardi, G.; Hannan, M. A.; Polo, A.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - STAMPA. - 1476:1(2020), pp. 012006.1-012006.7. [10.1088/1742-6596/1476/1/012006]

NDT/NDE by means of a probabilistic differential compressive sensing method

Gottardi G.;Hannan M. A.;Polo A.
2020-01-01

Abstract

A novel microwave imaging (MI) method is proposed to deal with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures. The proposed technique exploits a probabilistic differential contrast source inversion (D-CSI) formulation of the inverse scattering (IS) problem, which is then effectively solved by means of a customized multi-Task Bayesian compressive sensing (MT-BCS) solver. Numerical results are shown to assess the effectiveness and robustness of the proposed NDT/NDE method, as well as to compare it. with a single-Task (ST-BCS) implementation within the same framework.
2020
1
Gottardi, G.; Hannan, M. A.; Polo, A.
NDT/NDE by means of a probabilistic differential compressive sensing method / Gottardi, G.; Hannan, M. A.; Polo, A.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - STAMPA. - 1476:1(2020), pp. 012006.1-012006.7. [10.1088/1742-6596/1476/1/012006]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/262066
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