Sfoglia per Serie
A computer program for structural refinement from thin film XRD patterns
1998-01-01 Leoni, Matteo; Scardi, Paolo
Application of the rietveld method to phase analysis of multilayered systems
1993-01-01 Lutterotti, Luca; Scardi, Paolo; A., Tomasi
Domain Size Analysis in the Rietveld Method
2010-01-01 W. I. F., David; Leoni, Matteo; Scardi, Paolo
Elastic behaviour of thin stabilized-zirconia coatings
2004-01-01 Scardi, Paolo; Leoni, Matteo; M., Loch; G., Barbezat
Elastic constants of LPPS stabilized-zirconia coatings
2002-01-01 Leoni, Matteo; Scardi, Paolo; M., Loch; G., Barbezat
Grain surface relaxation and grain interaction in powder diffraction
2004-01-01 Leoni, Matteo
Influence of crystallite size and microstrain on structure refinement
1991-01-01 Scardi, Paolo; Lutterotti, Luca; Di Maggio, Rosa; Maistrelli, Paul
Kinetics of Ag distributions in high lead glass by real time synchrotron powder diffraction
2000-01-01 B., Forti; A., Gualtieri; Leoni, Matteo; M., Prudenziati; C. C., Tang
Line profile analysis in Rietveld method and Whole-Powder-Pattern Fitting
2001-01-01 Scardi, Paolo; Y., Dong; Leoni, Matteo
Low temperature X-ray powder diffraction of ceria-stabilized Zirconia
1993-01-01 Maistrelli, Paul; Lutterotti, Luca; Scardi, Paolo
Microstructure and phase morphology of diamond thin films by synchrotron radiation X-ray diffraction
1996-01-01 G., Cappuccio; Leoni, Matteo; Scardi, Paolo; V., Sessa; M., Terranova
Multicapillary optics for materials science studies
2000-01-01 Scardi, Paolo; Setti, Sergio; Leoni, Matteo
On Faulting in Nanocrystallites of FCC Metals
2011-01-01 Beyerlein, Kenneth Roy; Leoni, Matteo; R. L., Snyder; Scardi, Paolo
Residual stress in diamond coatings by synchrotron radiation XRD
1996-01-01 Scardi, Paolo; Leoni, Matteo; V., Sessa; M., Terranova; G., Cappuccio
Residual stresses in polycrystalline thin films
2000-01-01 Scardi, Paolo; Y., Dong
Standard reference materials for the measurement of instrument resolution functions: effect of transparency
1998-01-01 J. I., Langford; Leoni, Matteo; Scardi, Paolo
Strain-texture correlation in r.f. magnetron sputtered thin films
2000-01-01 Leoni, Matteo; Y., Dong; Scardi, Paolo
Stress and diffusion in Nb-W bilayers
2000-01-01 U., Welzel; P., Lamparter; Leoni, Matteo; E. J., Mittemeijer
Stress in thin layers: grain interaction elastic constants and diffraction response
2000-01-01 J., Kamminga; Leoni, Matteo; U., Welzel; P., Lamparter; E. J., Mittemeijer
Structure-Microstructure Relationships in LiMn2O4 Spinel Phase
1998-01-01 V., Massarotti; M., Bini; D., Capsoni; Scardi, Paolo; Leoni, Matteo
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