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Mostrati risultati da 1 a 20 di 144
Titolo Anno di pubblicazione Autori Unitn File
Canonical transformations for relativistic particles 1-gen-1984 Cognola, GuidoDapor, MaurizioZerbini, Sergio
Formation of vanadium silicide by high dose ion implantation 1-gen-1987 Dapor, Maurizio +
Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy 1-gen-1987 Dapor, Maurizio +
Preparation of metal glasses by ion implantation and/or sputtering 1-gen-1988 Dapor, Maurizio +
Superconductivity in crystalline and amorphous Nb-Zr thin films 1-gen-1988 Dapor, MaurizioScotoni, Mario +
K x-ray emission spectra from eta-Al2O3 1-gen-1988 Dapor, Maurizio +
X-Ray multilayers for diffractometers, monochromators, and spectrometers 1-gen-1988 Dapor, Maurizio +
Structural investigation of Al2O3 formed by ion implantation at various doses 1-gen-1989 Dapor, Maurizio +
Development of a numerical simulation of depth profiles of multilayers composed of very thin layers 1-gen-1989 Dapor, Maurizio +
Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum 1-gen-1989 Dapor, Maurizio +
Physical properties of TiN thin films 1-gen-1989 Dapor, Maurizio +
Penetration of an electron beam in a solid material: a simple model and a numerical simulation 1-gen-1989 Dapor, Maurizio
Electrochemical and corrosion behaviour of BN-coated aluminium alloy surfaces 1-gen-1989 Fedrizzi, LorenzoGialanella, StefanoDapor, Maurizio +
Backscattering of electrons from solid targets 1-gen-1990 Dapor, Maurizio
Auger quantitative analysis and preferential sputtering in brass alloys 1-gen-1990 Dapor, Maurizio +
Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films 1-gen-1990 Fedrizzi, LorenzoDapor, MaurizioBonora, Pierluigi +
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 1-gen-1990 Paccagnella, AlessandroDapor, Maurizio +
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 1-gen-1990 Dapor, Maurizio +
Role of core levels ionization in the electron induced dissociation of silicon dioxide 1-gen-1990 Dapor, Maurizio +
Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets 1-gen-1991 Dapor, Maurizio
Mostrati risultati da 1 a 20 di 144
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